17

Near field scanning acoustic microscope and method

Year:
1994
Language:
english
File:
PDF, 130 KB
english, 1994
24

Defect characterization in the short-wavelength regime

Year:
1980
Language:
english
File:
PDF, 1.59 MB
english, 1980
34

A novel parametric-effect MEMS amplifier

Year:
2000
Language:
english
File:
PDF, 238 KB
english, 2000